Response Electronics CL6011B Spezifikationen Seite 133

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Original — December 1991
UM4.6:CS6003
Glossary-11
E
EAROM Acronym: Electrically Alterable Read-Only Memory
EDAS Acronym: Extended Data Acquisition System
EIA Acronym: Electronic Industries Association
Electrically Alterable Read-Only Memory (EAROM)
A type of semiconductor memory device, electrically erasable and
reprogrammable, that is used primarily for read-only information.
Electronic Industries Association (EIA)
A group of electronic manufacturers that creates industry standards for
communication between electronic devices. Among these standards are
RS-232 and RS-449.
Electromagnetic Interference (EMI)
The general category of electrical noise induced by radio frequency and
magnetic, electrostatic, or capacitive coupling.
Electrostatic Damage (ESD)
Deterioration of integrated circuits due to high levels of static electricity.
Symptoms of ESD include degradation of performance, device
malfunction, and complete failure.
EMI Acronym: Electromagnetic Interference
ENB Abbreviation: Enable
ENBL Abbreviation: Enable
Engineering Units (EU)
The range of measurement for an analog process variable. The low (0
percent) and high (100 percent) engineering unit limits define the
anticipated range of the variable. For example, low and high
engineering-unit values of 50 and 1550 might define a range for degrees
Fahrenheit. In this example, the EU span would be 1500 degrees; each
percent of the EU span would equal 15 degrees.
Engineering Units Descriptor
The name of the units an engineering units value represents. Possible
examples include MTRS for meters, LB/SQIN for pounds per square
inch, and DEGSCEL for degrees celsius.
Engineering Units High Value (EUHV)
Former name for High Engineering Units Scale Factor (HIEC).
Engineering Units Low Value (EULV)
Former name for Low Engineering Units Scale Factor (LOEC).
EAR - En
g
Glossary
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